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Winter 2008 Seminar Series
Friday, 2/22, at 3:30 p.m.
Room 264 MacQuigg Labs
Arda Genc
PhD Candidate, The Ohio State University
Advised by Dr. Hamish Fraser
Characterization of Nanoscale Metallic Multilayers
Abstract
As the thin film materials used in electronic and optical applications continue to decrease in thickness to the nanoscales, marked changes in functional properties are expected to occur due to changes in crystal structure of these materials. Therefore, such multilayer systems have been of considerable interest due to the ability to control properties by engineering the structure of materials at the nanoscales.
The new characterization tools allow direct imaging and analysis of such materials in order to link the performance variations with the crystal structure variations. Recently, there have been remarkable advances in aberration corrected column design of electron microscopes, which eventually led to sub-ngstrom (< 0.1nm) resolution imaging of the materials through parallel and/or spot illumination modes. In the latest literature, the capability of aberration corrected microscopy in 2D imaging of the unique material properties has been successfully addressed and unfortunately few work been conducted on the possible analytical applications of this technique. Here we have explored the benefits of using an aberration corrected probe in both imaging and quantitative microanalysis of nanoscale metallic multilayers and addressed the phase stability in Cu/Nb and Ti/Nb nanoscale metallic multilayers by the extensive usage of these advance characterization techniques.
Bio
Arda Genc was born in Turkey. He received BS/MS in 2000 from the Istanbul Technical University, Turkey where he also worked as a research associate in the Electron Microscopy Center. In 2002 he joined the Fraser group and since then he has been pursuing a PhD degree in Materials Science. His research involves electron/ion beam-materials interactions and application of advanced high-resolution (HR) imaging and microanalysis techniques in materials characterization. Recently he has been working on the development and characterization of a probe aberration corrected TITAN™ Scanning TEM system and a new low energy ion beam milling technique (Nanomill™) for the preparation of HRTEM samples.
